Title :
Conductor, dielectric and radiation losses in multilayer microstrip interconnection with dielectric cover for high performance packaging
Author :
Joshi, K.K. ; Pollard, R.D. ; Postoyalko, V.
Author_Institution :
Dept. of Electron., S.P. Coll., Pune, India
Abstract :
Frequency dependent conductor, dielectric and radiation losses from multilayer microstrip with dielectric overlay have been calculated using Green´s function in Fourier transform domain and compared with the measured data as well as other commercial software
Keywords :
Fourier transforms; Green´s function methods; dielectric losses; integrated circuit measurement; integrated circuit packaging; loss measurement; microstrip lines; microwave integrated circuits; microwave measurement; Fourier transform domain; Green´s function; conductor losses; dielectric cover; dielectric losses; frequency dependent conductor; high performance packaging; multilayer microstrip interconnection; radiation losses; Conductors; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Fourier transforms; Frequency dependence; Frequency measurement; Green´s function methods; Microstrip; Nonhomogeneous media;
Conference_Titel :
Electrical Performance of Electronic Packaging, 1995
Conference_Location :
Portland, OR
Print_ISBN :
0-7803-3034-X
DOI :
10.1109/EPEP.1995.524697
