DocumentCode
3377761
Title
Study on optimization potential influencing factors in simulation studies focused on parallel batch machine scheduling using Variable Neighbourhood Search
Author
Kohn, Robert ; Rose, Oliver
Author_Institution
Inst. fur Tech. Inf., Univ. der Bundeswehr Munchen, Neubiberg, Germany
fYear
2012
fDate
9-12 Dec. 2012
Firstpage
1
Lastpage
13
Abstract
Studies on operational lot scheduling in semiconductor manufacturing show significantly varying optimization potentials, depending on a multitude of factors relating to methods and models in simulation. We present experiments examining Variable Neighbourhood Search (VNS) used to improve the objectives queuing time and tardiness for the parallel batch machine scheduling problem. The discussed results incorporate the effects of specific model characteristics and constraints, namely incompatible job families, process dedication schemes, critical time bounds, and minimal batch size constraints among others. With regard to methodical factors, we examine the effect of time window decomposition on simulation results, and we discuss fundamental VNS settings, respectively their influence on improvements measured for problem instances of size relevant for industrial applications. This study intends to identify important factors in scheduling studies and evaluates their influence on optimization potentials based on extensive experiments.
Keywords
batch processing (industrial); job shop scheduling; optimisation; search problems; semiconductor device manufacture; simulation; VNS; critical time bound; industrial application; job families; minimal batch size constraint; model characteristics; model constraint; operational lot scheduling; optimization potential influencing factor; parallel batch machine scheduling problem; process dedication scheme; queuing time; semiconductor manufacturing; simulation; tardiness; time window decomposition; variable neighbourhood search; Computational modeling; Job shop scheduling; Object oriented modeling; Optimization; Processor scheduling; Semiconductor device modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation Conference (WSC), Proceedings of the 2012 Winter
Conference_Location
Berlin
ISSN
0891-7736
Print_ISBN
978-1-4673-4779-2
Electronic_ISBN
0891-7736
Type
conf
DOI
10.1109/WSC.2012.6465273
Filename
6465273
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