Title :
Suppression of radiated emission from an 8-bit micro-controller using gate-oxide filtering capacitors
Author :
Kim, Hyungsoo ; Kim, Jonghoon ; Ryu, Woonghwan ; Sung, Myunghee ; Ahn, Seungyoung ; Kim, Joungho
Author_Institution :
Dept. of Electr. Eng., KAIST, Taejon, South Korea
Abstract :
The voltage fluctuations of the power/ground lines on ICs, packages, and modules have become the major source of the radiated emission. Combined suppression techniques including shielding, cabling and filtering at the package level and the module level are not enough for the complete suppression of radiated emission. Moreover, the power/ground line fluctuations and the resulted radiated emissions caused by the IC surge current must be controlled and considered at the IC design procedure. We have demonstrated more than 10-dB suppression of the radiated emission from a commercial 8-bit micro-controller using on-chip gate oxide filtering capacitors. The filtering capacitors are placed under the power/ground buses and the signal buses without ever increasing the die size
Keywords :
CMOS integrated circuits; capacitors; electromagnetic interference; electromagnetic shielding; interference suppression; microcontrollers; modules; packaging; surges; 8 bit; EMI; IC design; IC surge current; cabling; die size; gate-oxide filtering capacitors; microcontroller; module level; modules; n-well CMOS process; package level; packages; power/ground buses; power/ground lines; radiated emission; radiated emission suppression; shielding; signal buses; voltage fluctuations; Bonding; Capacitors; Filtering; High speed integrated circuits; Integrated circuit noise; Noise generators; Noise reduction; Packaging; Submillimeter wave filters; Voltage fluctuations;
Conference_Titel :
Electromagnetic Compatibility, 1999 IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-5057-X
DOI :
10.1109/ISEMC.1999.810124