Title :
Fault coverage and yield predictions: do we need more than 100% coverage?
Author :
Huisman, Leendert M.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
The influence of non-random defect distributions and of non-modelled faults on the behavior of the cumulative chip fallout as a function of the cumulative fault coverage is discussed. The theory is applied to published yield data and a novel explanation of the deviation of these data from the classical Williams-Brown theory is presented
Keywords :
failure analysis; fault location; integrated circuit testing; logic testing; probability; production testing; IC testing; Williams-Brown theory; clustering; cumulative chip fallout; cumulative fault coverage; nonrandom defects; probability; stuck-at faults; yield predictions; Arc discharges; Logic testing; Poisson equations; Probability; Random processes; Semiconductor device modeling;
Conference_Titel :
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location :
Rotterdam
Print_ISBN :
0-8186-3360-3
DOI :
10.1109/ETC.1993.246519
