Title :
RF isolation using power islands in DC power bus design
Author :
Fan, Jun ; Ren, Yong ; Chen, Juan ; Hockanson, David M. ; Shi, Hao ; Drewniak, James L. ; Hubing, Todd H. ; Van Doren, Thomas P. ; Dubroff, Richard E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Missouri Univ., Rolla, MO, USA
Abstract :
Power island structures are often employed for minimizing the propagation of high-frequency noise on DC power buses. The rationale is based on introducing a series impedance in the power plane to provide isolation of a noise source from the rest of the PCB design. The power island concept is investigated herein experimentally, to determine its noise mitigation attributes and limitations. A modeling approach that is suitable for arbitrary PCB island geometries including lumped SMT decoupling capacitors is also presented. The modeling and measurements indicate that island structures can achieve some degree of isolation under certain conditions
Keywords :
capacitors; electric impedance; electric potential; integral equations; island structure; noise; printed circuit layout; radiofrequency interference; surface mount technology; CEMPIE; DC power bus design; EMI; PCB design; PCB island geometries; PCB layout; RF isolation; high-frequency noise propagation; lumped SMT decoupling capacitors; measurements; mixed potential integral equation; modeling approach; noise mitigation attributes; noise source isolation; power islands; power plane; series impedance; Capacitance; Capacitors; Circuit noise; Electromagnetic compatibility; Impedance; Neck; Noise reduction; Power measurement; Radio frequency; Surface-mount technology;
Conference_Titel :
Electromagnetic Compatibility, 1999 IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-5057-X
DOI :
10.1109/ISEMC.1999.810129