Title :
Functional memory array testing using associative search algorithms
Author :
Elm, Christian ; Tavangarian, Djamshid
Author_Institution :
Fern Univ. Hagen, Tech. Inf., Germany
Abstract :
To accelerate functional memory array testing in advanced workstations, a conventional memory array is proposed to be modified using circuit structures known from flag-oriented associative memories. Thus memory array lines can be tested in parallel using associative search operations. All memory chips are tested in parallel using conventional tests. The drastic test speed up due to the new approach is discussed and the structure of an AT-bus memory board implementation is presented
Keywords :
automatic testing; content-addressable storage; fault location; integrated circuit testing; integrated memory circuits; parallel algorithms; AT-bus memory board; DRAM; SRAM; advanced workstations; associative search algorithms; circuit structures; fault model; flag-oriented associative memories; functional memory array testing; memory chips; Associative memory; Circuit faults; Circuit testing; Decoding; Employment; Life estimation; Production; Random access memory; Test equipment; Workstations;
Conference_Titel :
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location :
Rotterdam
Print_ISBN :
0-8186-3360-3
DOI :
10.1109/ETC.1993.246523