DocumentCode
3377936
Title
Multiple feature extraction for early Parkinson risk assessment based on transcranial sonography image
Author
Chen, Lei ; Seidel, Günter ; Mertins, Alfred
Author_Institution
Inst. for Signal Process., Univ. of Luebeck, Luebeck, Germany
fYear
2010
fDate
26-29 Sept. 2010
Firstpage
2277
Lastpage
2280
Abstract
Transcranial sonography (TCS) is a new tool for the diagnosis of Parkinson´s disease (PD) at a very early state. The TCS image of mesencephalon shows a distinct hyperechogenic pattern in about 90% PD patients. This pattern is usually manually segmented and the substantia nigra (SN) region can be used as an early PD indicator. However this method is based on manual evaluation of examined images. The extraction of multiple features from TCS images characterizing the half mesencephalon morphology and structure can be used to validate the observer-independent PD indicator. We propose hybrid feature extraction methods which includes statistical, geometrical and texture features for the early PD risk assessment. These features are tested with support vector machines (SVMs). Furthermore five features are selected with the sequential feature selection methods. The results show that the correct rate of the classification with these five features is reaching 96%.
Keywords
biomedical ultrasonics; diseases; feature extraction; image texture; medical image processing; statistical analysis; support vector machines; Parkinson disease diagnosis; Parkinson risk assessment; SVM; TCS; geometrical feature; hyperechogenic pattern; mesencephalon; multiple feature extraction; statistical feature; substantia nigra; support vector machine; texture feature; transcranial sonography; transcranial sonography image; Feature extraction; Image segmentation; Manganese; Parkinson´s disease; Support vector machines; Tin; Ultrasonic imaging; Early diagnosis; Parkinson´s Disease; Transcranial sonography; classification; texture analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location
Hong Kong
ISSN
1522-4880
Print_ISBN
978-1-4244-7992-4
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2010.5654216
Filename
5654216
Link To Document