Implementation of the transient response measurement of mixed-signal circuits

Author

Shepherd, P.R. ; Bertin, A. ; Al-Qutayri, M.A.

Author_Institution

Sch. of Electron. & Electr. Eng., Bath Univ., UK

fYear

1993

fDate

19-22 Apr 1993

Firstpage

66

Lastpage

73

Abstract

This paper presents the practical realisation of the transient response analysis proposed previously (1990, 1991) for the testing of mixed analogue/digital circuits. In this measurement system the circuit under test (CUT) is stimulated by a series of pulses in the form of a pseudo random binary sequence (PRBS). The transient response of the circuit is captured using a high speed analogue-digital converter and then transferred to a computer for subsequent signal analysis. The hardware system is described and results presented for both analogue and mixed signal circuits

Keywords

automatic testing; integrated circuit testing; linear integrated circuits; mixed analogue-digital integrated circuits; random processes; signal processing; transient response; analogue circuits; high speed analogue-digital converter; mixed-signal circuits; pseudo random binary sequence; signal analysis; transient response measurement; Analog-digital conversion; Binary sequences; Circuit analysis computing; Circuit testing; Digital circuits; Pulse circuits; Pulse measurements; System testing; Transient analysis; Transient response;

fLanguage

English

Publisher

ieee

Conference_Titel

European Test Conference, 1993. Proceedings of ETC 93., Third

Conference_Location

Rotterdam

Print_ISBN

0-8186-3360-3

Type

conf

DOI

10.1109/ETC.1993.246532

Filename

246532