Title :
Towards a mixed-signal testability bus standard P1149.4
Author :
Wilkins, B.R. ; Oresjo, S. ; Suparjo, B.S.
Author_Institution :
Dept. of Electron. & Comput. Sci., Southampton Univ., UK
Abstract :
A Working Group of the IEEE has been working towards the development of a standard testability structure to be built into mixed-signal chips. The structure is intended to be used to facilitate the testing of mixed-signal circuits at all levels from chip to system, and will form part of the IEEE 1149 set of Standards. This paper reviews the progress that has been made by 1993, and indicates the kind of structure that the Working Group is considering
Keywords :
design for testability; integrated circuit testing; mixed analogue-digital integrated circuits; standards; 1993; IEEE 1149 set of Standards; mixed-signal chips; mixed-signal circuits; mixed-signal testability bus standard P1149.4; Access protocols; Circuit testing; Computer architecture; Computer science; Digital circuits; Electronic circuits; Electronic equipment testing; Notice of Violation; Standards development; USA Councils;
Conference_Titel :
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location :
Rotterdam
Print_ISBN :
0-8186-3360-3
DOI :
10.1109/ETC.1993.246533
