Title :
Testability and test protocol expansion in hierarchical macro testing
Author :
Marinissen, Erik Jan ; Kuiper, Krijn ; Wouters, Clemens
Author_Institution :
Philips Res. Labs., Eindhoven, Netherlands
Abstract :
Test protocols play an important role within the macro tests strategy. They describe, independently of the actual test pattern values and in detail how, at which terminals, and at which moments tests stimuli should be applied and responses should be observed. Initially, test protocols are described at the terminals of the macro they test. Final execution should take place at the chip pins. Transforming a test protocol defined at the (local) macro terminals into a test protocol defined at the (global) chip pins is called test protocol expansion. Failing test protocol expansion indicates testability problems of the circuit under consideration
Keywords :
automatic testing; design for testability; fault location; integrated circuit testing; ASIC; TDA1307; Video Datapath Chip; chip pins; hierarchical macro testing; macro terminals; test protocol expansion; testability; Access protocols; Circuit testing; Electronic equipment testing; Electronic mail; Hardware; Integrated circuit testing; Laboratories; Lakes; Pins; Silicon;
Conference_Titel :
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location :
Rotterdam
Print_ISBN :
0-8186-3360-3
DOI :
10.1109/ETC.1993.246536