• DocumentCode
    3378154
  • Title

    Stretching the limit of microarchitectural level leakage control with Adaptive Light-Weight Vth Hopping

  • Author

    Xu, Hao ; Jone, Wen-Ben ; Vemuri, Ranga

  • Author_Institution
    Dept. of ECE, Univ. of Cincinnati, Cincinnati, OH, USA
  • fYear
    2010
  • fDate
    7-11 Nov. 2010
  • Firstpage
    632
  • Lastpage
    636
  • Abstract
    Power gating (PG) and body biasing (BB) are popular leakage control techniques at microarchitectural level. However, their large overhead prevents them from being applied for active leakage reduction. The overhead problem is further magnified by temperature and process variation, leading to the “corner case leakage control” problem. This paper presents an Adaptive Light-Weight Vth Hopping technique. This technique dramatically reduces the overhead for mode transition, addresses the corner case leakage control problem, and thus enables active leakage control.
  • Keywords
    hopping conduction; integrated circuit design; leakage currents; low-power electronics; active leakage reduction; adaptive light-weight Vth hopping; body biasing; corner case leakage control; microarchitectural level leakage control; power gating; Central Processing Unit; Equations; Monitoring; Radiation detectors; Runtime; TV; Temperature control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer-Aided Design (ICCAD), 2010 IEEE/ACM International Conference on
  • Conference_Location
    San Jose, CA
  • ISSN
    1092-3152
  • Print_ISBN
    978-1-4244-8193-4
  • Type

    conf

  • DOI
    10.1109/ICCAD.2010.5654230
  • Filename
    5654230