DocumentCode :
3378154
Title :
Stretching the limit of microarchitectural level leakage control with Adaptive Light-Weight Vth Hopping
Author :
Xu, Hao ; Jone, Wen-Ben ; Vemuri, Ranga
Author_Institution :
Dept. of ECE, Univ. of Cincinnati, Cincinnati, OH, USA
fYear :
2010
fDate :
7-11 Nov. 2010
Firstpage :
632
Lastpage :
636
Abstract :
Power gating (PG) and body biasing (BB) are popular leakage control techniques at microarchitectural level. However, their large overhead prevents them from being applied for active leakage reduction. The overhead problem is further magnified by temperature and process variation, leading to the “corner case leakage control” problem. This paper presents an Adaptive Light-Weight Vth Hopping technique. This technique dramatically reduces the overhead for mode transition, addresses the corner case leakage control problem, and thus enables active leakage control.
Keywords :
hopping conduction; integrated circuit design; leakage currents; low-power electronics; active leakage reduction; adaptive light-weight Vth hopping; body biasing; corner case leakage control; microarchitectural level leakage control; power gating; Central Processing Unit; Equations; Monitoring; Radiation detectors; Runtime; TV; Temperature control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design (ICCAD), 2010 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
ISSN :
1092-3152
Print_ISBN :
978-1-4244-8193-4
Type :
conf
DOI :
10.1109/ICCAD.2010.5654230
Filename :
5654230
Link To Document :
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