DocumentCode
3378154
Title
Stretching the limit of microarchitectural level leakage control with Adaptive Light-Weight Vth Hopping
Author
Xu, Hao ; Jone, Wen-Ben ; Vemuri, Ranga
Author_Institution
Dept. of ECE, Univ. of Cincinnati, Cincinnati, OH, USA
fYear
2010
fDate
7-11 Nov. 2010
Firstpage
632
Lastpage
636
Abstract
Power gating (PG) and body biasing (BB) are popular leakage control techniques at microarchitectural level. However, their large overhead prevents them from being applied for active leakage reduction. The overhead problem is further magnified by temperature and process variation, leading to the “corner case leakage control” problem. This paper presents an Adaptive Light-Weight Vth Hopping technique. This technique dramatically reduces the overhead for mode transition, addresses the corner case leakage control problem, and thus enables active leakage control.
Keywords
hopping conduction; integrated circuit design; leakage currents; low-power electronics; active leakage reduction; adaptive light-weight Vth hopping; body biasing; corner case leakage control; microarchitectural level leakage control; power gating; Central Processing Unit; Equations; Monitoring; Radiation detectors; Runtime; TV; Temperature control;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer-Aided Design (ICCAD), 2010 IEEE/ACM International Conference on
Conference_Location
San Jose, CA
ISSN
1092-3152
Print_ISBN
978-1-4244-8193-4
Type
conf
DOI
10.1109/ICCAD.2010.5654230
Filename
5654230
Link To Document