On scan path design for stuck-open and delay fault detection

A novel scan path design technique is presented, which facilitates the application of two-pattern tests by transition shifting. The scan path is composed based on the test data set as a graph matching problem. For the reduction of the required test application time, a novel reconfigurable scan path architecture is presented, which is synthesized based on the test data set. This reconfigurable scan path concept is applicable not only to two-pattern test sets but also when the test program has been generated for stuck-at faults