• DocumentCode
    3378325
  • Title

    Self-Aligned Stylus with High Sphericity for Micro Coordinate Measurement

  • Author

    Tsai, Y.-C. ; Chang, D.-R. ; Tsao, L.-C. ; Wu, M.-D. ; Shih, P.-J. ; Shih, W.-P.

  • Author_Institution
    Nat. Taiwan Univ., Taipei
  • fYear
    2007
  • fDate
    10-14 June 2007
  • Firstpage
    1641
  • Lastpage
    1644
  • Abstract
    This paper presents a mask-free fabrication of styluses with high sphericity for micro coordinate measurement machine (muCMM), a mechanical system using micro-scale contact probes to measure the profile of high-aspect-ratio micro-structures. This new process combines micro-pellet and stylus into one mechanical device. The micro-pellets are self-configured inside aqueous environment in which the surface tension deforms the pellets into prefect spheres. Stylus arrays were patterned by self-aligned waveguides. This process enables the center of the micro-sphere to accurately coincide with the longitudinal axis of stylus and hence the Abbe error for the muCMM can be significantly reduced.
  • Keywords
    micromachining; micromechanical devices; waveguides; Abbe error; mask-free fabrication; mechanical system; micro-scale contact probes; microcoordinate measurement machine; self-aligned stylus; stylus arrays; surface tension; waveguides; Coordinate measuring machines; Displacement measurement; Fabrication; Gravity; Lenses; Mechanical variables measurement; Microoptics; Probes; Scanning electron microscopy; Surface tension; Self-alignment; micro coordinate measurement; spherical stylus;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International
  • Conference_Location
    Lyon
  • Print_ISBN
    1-4244-0842-3
  • Electronic_ISBN
    1-4244-0842-3
  • Type

    conf

  • DOI
    10.1109/SENSOR.2007.4300464
  • Filename
    4300464