Title :
A model for predicting the reflection coefficient for hollow pyramidal absorbers
Author :
Holloway, Christopher L. ; Johansson, Martin ; Kuester, Edward F. ; Johnk, Robert T. ; Novotny, David R.
Author_Institution :
Inst. for Telecommun. Sci., Boulder, CO, USA
Abstract :
We present an expression for the effective material properties of electromagnetic hollow pyramidal absorbers. This expression can be used to efficiently calculate the reflection coefficient of this absorbing structure. The reflection coefficients based on this model have been compared to and closely agree with calculated finite element results. We show how the reflection coefficient varies as a function of the absorber wall thickness. Measurement data for a hollow absorber obtained using time-domain measurement techniques are also presented
Keywords :
electromagnetic wave absorption; electromagnetic wave reflection; materials properties; periodic structures; time-domain analysis; EM hollow pyramidal absorbers; absorber wall thickness; finite element results; material properties; measurement data; periodic structure; reflection coefficient; time-domain measurement; Anisotropic magnetoresistance; Electromagnetic reflection; Geometry; Material properties; Maxwell equations; Nonuniform electric fields; Permittivity; Predictive models; Solids; Tensile stress;
Conference_Titel :
Electromagnetic Compatibility, 1999 IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-5057-X
DOI :
10.1109/ISEMC.1999.810162
