A model for predicting the reflection coefficient for hollow pyramidal absorbers

Author

Holloway, Christopher L. ; Johansson, Martin ; Kuester, Edward F. ; Johnk, Robert T. ; Novotny, David R.

Author_Institution

Inst. for Telecommun. Sci., Boulder, CO, USA

Volume

2

fYear

1999

fDate

1999

Firstpage

861

Abstract

We present an expression for the effective material properties of electromagnetic hollow pyramidal absorbers. This expression can be used to efficiently calculate the reflection coefficient of this absorbing structure. The reflection coefficients based on this model have been compared to and closely agree with calculated finite element results. We show how the reflection coefficient varies as a function of the absorber wall thickness. Measurement data for a hollow absorber obtained using time-domain measurement techniques are also presented

Keywords

electromagnetic wave absorption; electromagnetic wave reflection; materials properties; periodic structures; time-domain analysis; EM hollow pyramidal absorbers; absorber wall thickness; finite element results; material properties; measurement data; periodic structure; reflection coefficient; time-domain measurement; Anisotropic magnetoresistance; Electromagnetic reflection; Geometry; Material properties; Maxwell equations; Nonuniform electric fields; Permittivity; Predictive models; Solids; Tensile stress;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 1999 IEEE International Symposium on

Conference_Location

Seattle, WA

Print_ISBN

0-7803-5057-X

Type

conf

DOI

10.1109/ISEMC.1999.810162

Filename

810162