Title :
Phase coherent, event synchronized test system architecture
Author :
Dinteman, Bryan J.
Abstract :
It is increasingly difficult to provide test conditions utilising ATE equipment which correlate with applications conditions in which devices are designed to operate. This paper suggests functional parameters and an architecture conductive to successful and economical ATE testing of time differentiated functionality
Keywords :
Frequency conversion; Frequency synchronization; Hardware; Instruments; Qualifications; Resumes; Sampling methods; Signal generators; System testing; Timing;
Conference_Titel :
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location :
Rotterdam
Print_ISBN :
0-8186-3360-3
DOI :
10.1109/ETC.1993.246569
