DocumentCode :
3378405
Title :
Modules for gigahertz digital testing of ECL
Author :
Keezer, D.C.
Author_Institution :
Dept. of Electr. Eng., Univ. of South Florida, Tampa, FL, USA
fYear :
1993
fDate :
19-22 Apr 1993
Firstpage :
320
Lastpage :
328
Abstract :
A family of high-speed, low-cost multiplexer and data capture circuits is introduced. These hybrid circuits are based on previously introduced principles and are used to extend the upper frequency limits of existing test systems. The modules are based on low-cost ECL technology yet support testing up to about 1 Gpbs. Multiplexers with typical edge rates of 500 ps are demonstrated. Subnanosecond-wide data bits are captured with either a multi-pass sampling circuit or a single-pass demultiplexer. The family of modules includes a variety of reusable circuits for pattern generation and data capture. Through 8:1 pin multiplexing, the paper demonstrates extension of a 200 MHz host system to beyond 1 GHz. These modules have been used in limited cases at frequencies about 1.5 GHz
Keywords :
automatic testing; demultiplexing; emitter-coupled logic; logic testing; modules; multiplexing equipment; 1 Gbit/s; 1.5 GHz; 200 MHz to 1 GHz; ECL; data capture circuits; gigahertz digital testing; hybrid circuits; logic testing; low-cost multiplexer; multi-pass sampling circuit; pattern generation; single-pass demultiplexer; Bandwidth; Circuit testing; Connectors; Frequency; Gallium arsenide; Logic testing; Multiplexing; Sampling methods; System testing; Timing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location :
Rotterdam
Print_ISBN :
0-8186-3360-3
Type :
conf
DOI :
10.1109/ETC.1993.246570
Filename :
246570
Link To Document :
بازگشت