Title :
Analysis and Experimental Validation of Electromechanical Buckling
Author :
Elata, D. ; Abu-Salih, S.
Author_Institution :
Technion - Israel Inst. of Technol., Haifa
Abstract :
We show that a symmetric electrostatic field can precipitately instigate buckling in a sub- critically loaded slender structure, and even instigate buckling when the slender structure is subjected to a tensile load. This work includes both theoretical analysis and experimental validation of electromechanical buckling. To this end, special microdevices where designed, fabricated and characterized. The significance of the work is that it generalizes the notion of mechanical buckling by considering the coupling of mechanical and electromechanical bifurcations.
Keywords :
bifurcation; buckling; electric fields; electromechanical effects; electromechanical bifurcations; electromechanical buckling; microdevices; sub-critically loaded slender structure; symmetric electrostatic field; Bifurcation; Boundary conditions; Electrodes; Electrostatic actuators; Electrostatic analysis; Mechanical engineering; Micromechanical devices; Stability; Stators; Voltage; Electrostatic actuation; buckling; electromechanical instability;
Conference_Titel :
Solid-State Sensors, Actuators and Microsystems Conference, 2007. TRANSDUCERS 2007. International
Conference_Location :
Lyon
Print_ISBN :
1-4244-0842-3
Electronic_ISBN :
1-4244-0842-3
DOI :
10.1109/SENSOR.2007.4300471