Title :
Basic boundary-scan for in-circuit test
Author :
Albee, Alan J. ; Ellis, Mark ; Robinson, Gordon D.
Author_Institution :
GenRad Inc., Concord, MA, USA
Abstract :
Boundary-scan was developed to allow testing without a full bed-of-nails, but many boards have only a few boundary-scan parts, and still require a full bed-of-nails. The manufacturers of those boards are getting many advantages from the use of boundary-scan, including faster model development time for complex parts, faster test run times, faster model and board debug times and much more accurate diagnosis than a conventional in-circuit test provides. This paper describes a tool that provides these benefits without needing any change to the main in-circuit test system
Keywords :
automatic testing; boundary scan testing; printed circuit testing; BasicSCAN; PCB testing; boundary scan testing; in-circuit model; in-circuit test; test generator; Circuit faults; Circuit testing; Fault detection; Fixtures; Logic devices; Logic testing; Pins; Standards development; System testing; Virtual manufacturing;
Conference_Titel :
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location :
Rotterdam
Print_ISBN :
0-8186-3360-3
DOI :
10.1109/ETC.1993.246574