DocumentCode :
3378570
Title :
Testing mixed signal ASICs through the use of supply current monitoring
Author :
Eckersall, K.R. ; Wrighton, P.L. ; Bell, I.M. ; Bannister, B.R. ; Taylor, G.E.
Author_Institution :
Hull Univ., UK
fYear :
1993
fDate :
19-22 Apr 1993
Firstpage :
385
Lastpage :
391
Abstract :
The authors investigate testing of mixed signal integrated circuits. Several approaches are proposed, most requiring careful partitioning of the analogue and digital sections. However, the use of supply current monitoring is applicable to both digital and analogue sections. Digital testing has been widely investigated, concentrating on quiescent Iddq testing. Using pseudo-random binary test signals with supply current testing, high fault coverage of both catastrophic FET faults and gate oxide shorts in the analogue section is shown to be obtainable. Use of on-chip supply sensors has also been investigated
Keywords :
application specific integrated circuits; fault location; integrated circuit testing; mixed analogue-digital integrated circuits; catastrophic FET faults; fault coverage; gate oxide shorts; on-chip supply sensors; pseudo-random binary test signals; quiescent Iddq testing; supply current monitoring; Application specific integrated circuits; Automatic testing; Circuit faults; Circuit testing; Costs; Current supplies; Design for testability; Integrated circuit testing; Logic testing; Monitoring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location :
Rotterdam
Print_ISBN :
0-8186-3360-3
Type :
conf
DOI :
10.1109/ETC.1993.246580
Filename :
246580
Link To Document :
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