DocumentCode :
3378595
Title :
A Fast Medical Image Registration Method Based on Nonlinear Correlation Measurement
Author :
Jin, Jing ; Wang, Qiang ; Shen, Yi
Author_Institution :
Dept. of Control Sci. & Eng., Harbin Inst. of Technol.
Volume :
2
fYear :
2005
fDate :
16-19 May 2005
Firstpage :
1429
Lastpage :
1432
Abstract :
In this paper a new approach to the problem of rigid body registration is proposed, using a concept of nonlinear correlation information entropy (NCIE) as the new matching criterion. The presented method applies NCIE to measure the correlation degree between the image intensities of corresponding voxel in both images. Registration is achieved by adjustment of the relative position until the NCIE between the images is maximized. However, unlike the mutual information, NCIE changes in the closed interval [0, 1], and around the extremum it varies sharply, which makes it possible that a threshold of NCIE can be used to boost the search to registration transformation. Using this feature of NCIE, we registered a rotated floating image with a reference image combined the variant step-size searching for further enhancing the searching speed. Our results demonstrate the proposed method can take care the differences in contrast between the floating and reference images. Meanwhile, as the mutual information, NCIE criterion can be achieved automatically and without any preprocessing
Keywords :
biomedical measurement; correlation methods; entropy; image matching; image registration; medical image processing; floating image; medical image registration; nonlinear correlation information entropy; nonlinear correlation measurement; reference image; registration transformation; rigid body registration; step-size searching; Anatomy; Biomedical engineering; Biomedical image processing; Biomedical imaging; Image registration; Information entropy; Medical diagnostic imaging; Mutual information; Optical imaging; X-ray imaging; Image Registration; Medical Image Processing; Nonlinear Correlation Information Entropy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE
Conference_Location :
Ottawa, Ont.
Print_ISBN :
0-7803-8879-8
Type :
conf
DOI :
10.1109/IMTC.2005.1604386
Filename :
1604386
Link To Document :
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