DocumentCode
3378678
Title
Aliasing minimization in signature analysis testing
Author
Olivo, Piero ; Damiani, Maurizio ; Riccò, Bruno
Author_Institution
Bologna Univ., Italy
fYear
1993
fDate
19-22 Apr 1993
Firstpage
451
Lastpage
456
Abstract
This paper reconsiders the problem of the design of optimal signature registers for BIST applications. Different strategies should be considered in designing multiple-input and single-input registers. For multiple-input registers, aliasing minimization cannot be the only guiding criterion: it is shown that the performance of a register with regards to aliasing depends strongly on the nature of the circuit under test and on the effects of the fault at its outputs. It is therefore preferable to choose a register that performs satisfactorily regardless of the circuit tested and of the test length chosen, i.e. a maximally reliable register. Registers based on primitive feedback polynomials are identified as the most reliable, in terms of asymptotic as well as transient behavior of the aliasing probability
Keywords
built-in self test; design for testability; logic testing; minimisation; polynomials; probability; shift registers; BIST; aliasing probability; multiple-input registers; optimal signature registers; primitive feedback polynomials; reliability; signature analysis testing; single-input registers; transient behavior; Built-in self-test; Circuit analysis; Circuit faults; Circuit testing; Feedback; Fires; Integrated circuit measurements; Length measurement; Performance evaluation; Shift registers;
fLanguage
English
Publisher
ieee
Conference_Titel
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location
Rotterdam
Print_ISBN
0-8186-3360-3
Type
conf
DOI
10.1109/ETC.1993.246591
Filename
246591
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