DocumentCode :
33787
Title :
Bin Ratio-Based Histogram Distances and Their Application to Image Classification
Author :
Weiming Hu ; Nianhua Xie ; Ruiguang Hu ; Haibin Ling ; Qiang Chen ; Shuicheng Yan ; Maybank, Steve
Author_Institution :
Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
Volume :
36
Issue :
12
fYear :
2014
fDate :
Dec. 1 2014
Firstpage :
2338
Lastpage :
2352
Abstract :
Large variations in image background may cause partial matching and normalization problems for histogram-based representations, i.e., the histograms of the same category may have bins which are significantly different, and normalization may produce large changes in the differences between corresponding bins. In this paper, we deal with this problem by using the ratios between bin values of histograms, rather than bin values´ differences which are used in the traditional histogram distances. We propose a bin ratio-based histogram distance (BRD), which is an intra-cross-bin distance, in contrast with previous bin-to-bin distances and cross-bin distances. The BRD is robust to partial matching and histogram normalization, and captures correlations between bins with only a linear computational complexity. We combine the BRD with the ℓ1 histogram distance and the χ2 histogram distance to generate the ℓ1 BRD and the χ2 BRD, respectively. These combinations exploit and benefit from the robustness of the BRD under partial matching and the robustness of the ℓ1 and χ2 distances to small noise. We propose a method for assessing the robustness of histogram distances to partial matching. The BRDs and logistic regression-based histogram fusion are applied to image classification. The experimental results on synthetic data sets show the robustness of the BRDs to partial matching, and the experiments on seven benchmark data sets demonstrate promising results of the BRDs for image classification.
Keywords :
image classification; image matching; statistical analysis; BRD; bin ratio-based histogram distance; bin-to-bin distance; cross-bin distance; histogram bin value; histogram normalization; histogram-based representation; image background; image classification; intra-cross-bin distance; linear computational complexity; normalization problem; partial matching; Computational complexity; Distance measurement; Histograms; Image classification; Logistics; Pattern recognition; Histogram bin ratio; histogram distance; image classification;
fLanguage :
English
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher :
ieee
ISSN :
0162-8828
Type :
jour
DOI :
10.1109/TPAMI.2014.2327975
Filename :
6824768
Link To Document :
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