DocumentCode
3378765
Title
Testing of detection systems
Author
Leach, Graham
Author_Institution
Police Sci. Dev. Branch, Horsham, UK
fYear
1995
fDate
18-20 Oct 1995
Firstpage
104
Lastpage
109
Abstract
The phrase “probability of detection” (Pd) is often misused in the context of exterior electronic perimeter intrusion detection systems (PIDS). For example, a system which correctly detects when tested three times has detected at a rate of 100%, but might not have a “probability of detection” of 100%. “Pd” is often misused to describe this experimental result as a 100% probability of detection. “Confidence limits” for Pd can be estimated and minimum extents for testing can then be demanded. These confidence limits are sometimes calculated using the normal, or the chi-squared, statistical distributions. Using these distributions for PIDS testing is questionable because they are often used outside their region of validity. There are fundamental constraints which obstruct conventional statistical confidence limits for Pd from being found. Pd statistics are discussed and an exact way to express detection uncertainty using the binomial distribution is described. Ways to reduce testing, yet maintain confidence, are discussed. Experts are concerned that extensive, but unrepresentative, testing gives an unwarranted impression of reliability. This paper emphasises the importance of representative testing and the clear presentation of results
Keywords
alarm systems; binomial distribution; reliability theory; surveillance; PIDS testing; binomial distribution; chi-squared statistical distribution; confidence limits; detection rate; detection uncertainty; electronic perimeter intrusion detection systems; normal statistical distribution; probability of detection; reliability; representative testing; Contracts; Control systems; Costs; Intrusion detection; Maintenance; Probability; Security; Statistical distributions; System testing; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Security Technology, 1995. Proceedings. Institute of Electrical and Electronics Engineers 29th Annual 1995 International Carnahan Conference on
Conference_Location
Sanderstead
Print_ISBN
0-7803-2627-X
Type
conf
DOI
10.1109/CCST.1995.524741
Filename
524741
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