Title :
A new and secure selftest scheme for block cipher implementations
Author :
Bonnenberg, H. ; Curiger, A. ; Zimmermann, R. ; Felber, N. ; Kaeslin, H. ; Fichtner, W.
Author_Institution :
Integrated Syst. Lab., Swiss Federal Inst. of Technol., Zurich, Switzerland
Abstract :
A well-known theorem of communications theory has been applied to show the inherent test-friendliness of implementations of modern block ciphers. The resulting principle is the basis for the implementation of an efficient selftest scheme in a VLSI block cipher design in order to meet binding security requirements of cryptographic equipment
Keywords :
CMOS integrated circuits; VLSI; built-in self test; cryptography; electronic equipment testing; fault location; integrated circuit testing; CMOS; VLSI; block cipher; communications theory; cryptographic equipment; security; selftest; Built-in self-test; Cryptography; Data security; Electronic equipment testing; Laboratories; Observability; Protection; Random variables; System testing; Very large scale integration;
Conference_Titel :
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location :
Rotterdam
Print_ISBN :
0-8186-3360-3
DOI :
10.1109/ETC.1993.246600
