Title :
An approach to mixed circuits testing
Author :
Bracho, S. ; Martinez, Manuel ; Arguelles, J.
Author_Institution :
Cantabria Univ., Santander
Abstract :
A test stimuli generation and a signature analysis method are proposed for a mixed mode circuits. The processes are based on a catastrophic fault model simulated at the transistor level, and on a measure of the transient response of the current used by the circuit when applying the stimuli. A built-in dynamic current sensor is proposed in order to perform the transient analysis of the current used in an actual ATE systems
Keywords :
automatic test equipment; electric current measurement; electric sensing devices; fault location; logic testing; mixed analogue-digital integrated circuits; semiconductor device models; signal processing; transient response; ATE; catastrophic fault model; dynamic current sensor; mixed circuits testing; signature analysis; test stimuli generation; transient analysis; Circuit faults; Circuit testing; Current measurement; Electrical fault detection; Logic testing; Performance evaluation; Sensor systems; Signal generators; System testing; Transient response;
Conference_Titel :
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location :
Rotterdam
Print_ISBN :
0-8186-3360-3
DOI :
10.1109/ETC.1993.246602
