Title :
Considerations on impedance matrix determination for accurate passive device characterization
Author :
Wojnowski, M. ; Engl, M. ; Weigel, R.
Author_Institution :
Infineon Technol. AG, Neubiberg
Abstract :
For accurate RLCG-parameter extraction the measured S-parameter matrix needs to be converted to the Z-matrix. However, there exist three different definitions of S-parameters and consequently three different formulas of converting S-matrix into Z-matrix. In this article, we present an overview of existing S-parameters definitions and examine the uncertainties associated with the S-matrix to Z-matrix transformations. Further, we introduce an error estimator describing the inaccuracy one makes performing the incorrect transformation. We compare de-embedded measurement results of an inductor manufactured in Si-based MCM-D technology. We show that using wrong transformation can easily lead to erroneous or even catastrophic results.
Keywords :
S-parameters; impedance matrix; network analysers; RLCG-parameter extraction; S-parameter matrix; Si-based MCM-D technology; Z-matrix; impedance matrix determination; passive device characterization; Calibration; Circuit simulation; Impedance measurement; Inductors; Matrix converters; Scattering parameters; Transmission line matrix methods; Transmission line measurements; Voltage; Waveguide theory;
Conference_Titel :
Signal Propagation on Interconnects, 2007. SPI 2007. IEEE Workshop on
Conference_Location :
Genova
Print_ISBN :
978-1-4244-1223-5
Electronic_ISBN :
978-1-4244-1224-2
DOI :
10.1109/SPI.2007.4512226