Title :
A model for functional test generation and testability analysis
Author :
Gulbins, Matthias ; Straube, Bernd ; Elst, Günter
Author_Institution :
Fraunhofer Inst. fur Integrierte Schaltungen, Erlangen, Germany
Abstract :
An overview has been given of a new approach to functional test generation. The program GESTE permits the generation of symbolic tests by constructing a path through the graph model, establishing, and solving a system of equations and inequalities. The model extracted from a behavioural VHDL description contains control flow and, implicitly, data flow. The behavioural level fault model includes both faults in the data part and faults in the control part. A new method of testability analysis considers functional and structural aspects of the model. By means of a preference relation a decision is based on the multi-criteria controllability and observability measures. This testability analysis is used to select the best path for generating a test. The test generation program GESTE is under development. First results show that the method offers a promising way to generate symbolic tests
Keywords :
controllability; design for testability; electronic engineering computing; fault location; logic testing; observability; specification languages; GESTE; behavioural VHDL description; control flow; data flow; functional test generation; graph model; multi-criteria controllability; observability; symbolic tests; testability analysis; transfer function; Controllability; Costs; Digital systems; Equations; Logic testing; Observability; Process design; Prototypes; System testing;
Conference_Titel :
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location :
Rotterdam
Print_ISBN :
0-8186-3360-3
DOI :
10.1109/ETC.1993.246608