DocumentCode
3378938
Title
On the diagnosability of DNMR testing
Author
Guterman, A. ; Savaria, Y. ; Dagenais, M.
Author_Institution
Dept. of Electr. Eng., Ecole Polytech. de Montreal, Que., Canada
fYear
1993
fDate
19-22 Apr 1993
Firstpage
517
Lastpage
518
Abstract
Dynamic N-Modular Redundancy (DNMR), with interstitially placed voters, provides a testing technique with low area overhead and high diagnosability, applicable for fabrication-time and on-line real traffic testing of fault-tolerant processing arrays. Improved diagnosability is obtained not only by increasing the voting level, but also by using different test propagation methods. Also, diagnosis is based on a general fault model, without the restrictions imposed by other testing techniques. A lower bound on DNMR diagnosability shows very good results, particularly when an appropriate sequence of tests is applied
Keywords
fault location; fault tolerant computing; logic arrays; logic testing; production testing; redundancy; diagnosability; dynamic N-modular redundancy; fault-tolerant processing arrays; interstitially placed voters; test propagation; Automatic testing; Circuit faults; Circuit testing; Delay; Fault detection; Fault tolerance; Nuclear magnetic resonance; Runtime; Traffic control; Voting;
fLanguage
English
Publisher
ieee
Conference_Titel
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location
Rotterdam
Print_ISBN
0-8186-3360-3
Type
conf
DOI
10.1109/ETC.1993.246609
Filename
246609
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