• DocumentCode
    3378938
  • Title

    On the diagnosability of DNMR testing

  • Author

    Guterman, A. ; Savaria, Y. ; Dagenais, M.

  • Author_Institution
    Dept. of Electr. Eng., Ecole Polytech. de Montreal, Que., Canada
  • fYear
    1993
  • fDate
    19-22 Apr 1993
  • Firstpage
    517
  • Lastpage
    518
  • Abstract
    Dynamic N-Modular Redundancy (DNMR), with interstitially placed voters, provides a testing technique with low area overhead and high diagnosability, applicable for fabrication-time and on-line real traffic testing of fault-tolerant processing arrays. Improved diagnosability is obtained not only by increasing the voting level, but also by using different test propagation methods. Also, diagnosis is based on a general fault model, without the restrictions imposed by other testing techniques. A lower bound on DNMR diagnosability shows very good results, particularly when an appropriate sequence of tests is applied
  • Keywords
    fault location; fault tolerant computing; logic arrays; logic testing; production testing; redundancy; diagnosability; dynamic N-modular redundancy; fault-tolerant processing arrays; interstitially placed voters; test propagation; Automatic testing; Circuit faults; Circuit testing; Delay; Fault detection; Fault tolerance; Nuclear magnetic resonance; Runtime; Traffic control; Voting;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Test Conference, 1993. Proceedings of ETC 93., Third
  • Conference_Location
    Rotterdam
  • Print_ISBN
    0-8186-3360-3
  • Type

    conf

  • DOI
    10.1109/ETC.1993.246609
  • Filename
    246609