• DocumentCode
    3378958
  • Title

    A high-level test program language for analog and mixed-signal test program development

  • Author

    Harrold, S.J. ; Diamant, P.E.

  • Author_Institution
    Univ. of Manchester Inst. of Sci. & Technol., UK
  • fYear
    1993
  • fDate
    19-22 Apr 1993
  • Firstpage
    519
  • Lastpage
    520
  • Abstract
    A standard, generic, test program language (TPL) has been defined to ease the test program development task for analog and mixed-signal circuits. The language is used in the construction of links between simulation and test. The TPL allows designers to take responsibility for test program development, without the need for detailed knowledge of specific test instruments. The TPL test file is generated and executed through a Motif interface running under X-windows. The generic nature of TPL and the use of a standard software environment have been demonstrated to allow good portability of test programs between different test systems
  • Keywords
    analogue circuits; automatic testing; digital simulation; electronic engineering computing; high level languages; mixed analogue-digital integrated circuits; programming environments; software portability; user interfaces; Motif interface; X-windows; analog test program; high-level test program language; mixed-signal test program development; portability; standard software environment; Analytical models; Automatic testing; Circuit simulation; Circuit testing; Instruments; Signal generators; Software testing; System testing; Test equipment; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Test Conference, 1993. Proceedings of ETC 93., Third
  • Conference_Location
    Rotterdam
  • Print_ISBN
    0-8186-3360-3
  • Type

    conf

  • DOI
    10.1109/ETC.1993.246610
  • Filename
    246610