Title :
A high-level test program language for analog and mixed-signal test program development
Author :
Harrold, S.J. ; Diamant, P.E.
Author_Institution :
Univ. of Manchester Inst. of Sci. & Technol., UK
Abstract :
A standard, generic, test program language (TPL) has been defined to ease the test program development task for analog and mixed-signal circuits. The language is used in the construction of links between simulation and test. The TPL allows designers to take responsibility for test program development, without the need for detailed knowledge of specific test instruments. The TPL test file is generated and executed through a Motif interface running under X-windows. The generic nature of TPL and the use of a standard software environment have been demonstrated to allow good portability of test programs between different test systems
Keywords :
analogue circuits; automatic testing; digital simulation; electronic engineering computing; high level languages; mixed analogue-digital integrated circuits; programming environments; software portability; user interfaces; Motif interface; X-windows; analog test program; high-level test program language; mixed-signal test program development; portability; standard software environment; Analytical models; Automatic testing; Circuit simulation; Circuit testing; Instruments; Signal generators; Software testing; System testing; Test equipment; Virtual manufacturing;
Conference_Titel :
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location :
Rotterdam
Print_ISBN :
0-8186-3360-3
DOI :
10.1109/ETC.1993.246610
