Title :
Design for testability techniques applicable to analog circuits
Author :
Huertas, J.L. ; Rueda, A. ; Vazquez, D.
Author_Institution :
Dept. of Design of Analog Circuits, Centro Nacional de Microelectron., Sevilla, Spain
Abstract :
Strategies to incorporate design for testability techniques into analog and mixed-signal circuits are discussed, giving a special emphasis to analog filtering
Keywords :
CMOS integrated circuits; analogue circuits; design for testability; filters; integrated circuit testing; mixed analogue-digital integrated circuits; CMOS IC; analog circuits; analog filtering; automatic tuning; design for testability; mixed-signal circuits; programmable filters; Analog circuits; CMOS process; Capacitors; Circuit testing; Design for testability; Digital circuits; Filters; Silicon; Switches; Test equipment;
Conference_Titel :
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location :
Rotterdam
Print_ISBN :
0-8186-3360-3
DOI :
10.1109/ETC.1993.246612
