Title :
Testing analog circuits by using a sigma-delta modulator
Author :
Huertas, J.L. ; Rueda, A. ; Vazquez, D.
Author_Institution :
Dept. of Design of Analog Circuits, Centro Nacional de Microelectron., Sevilla, Spain
Abstract :
The use of sigma-delta modulators to improve the testability in analog and mixed-signal integrated circuits is discussed in this contribution. The proposed idea can be considered as a starting point for exploring the future capabilities offered by simplified data conversion subsystems to design for testability methodologies applicable to mixed-signal chips
Keywords :
design for testability; integrated circuit testing; linear integrated circuits; mixed analogue-digital integrated circuits; modulators; data conversion; mixed-signal integrated circuits; sigma-delta modulator; testability; Analog circuits; Analog-digital conversion; CMOS technology; Circuit testing; Communication cables; Data conversion; Delta-sigma modulation; Design for testability; Digital modulation; Filters;
Conference_Titel :
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location :
Rotterdam
Print_ISBN :
0-8186-3360-3
DOI :
10.1109/ETC.1993.246613
