Title :
Correlation of current mismatch and fill factor in amorphous and nanocrystalline silicon based high efficiency multi-junction solar cells
Author :
Yan, Baojie ; Yue, Guozhen ; Yang, Jeffrey ; Guha, Subhendu
Author_Institution :
United Solar Ovonic LLC, 1100 West Maple Road, Troy, Michigan, USA
Abstract :
We present a systematic analysis of the correlation of current mismatch in a-Si:H/nc-Si:H double-junction solar cell fill factor (FF) measured under colored lights. First, we propose a diagnostic method to evaluate the FFs of component cells in multi-junction solar cells using current-voltage measurements under colored lights. The analysis reveals that the over-estimated FF when a colored light is illuminated results from a significant current mismatch. A mathematical calculation demonstrates that the diagnostic method can be used to estimate the FFs of single-junction component cells in a multi-junction structure. Second, we present our recent progress in the optimization of a-Si:H and nc-Si:H based solar cells. We emphasize the importance of improving the compactness of nc-Si:H materials and controlling the nanocrystalline evolution. Finally, we report our new record initial active-area efficiency of 15.4% achieved using an a-Si:H/a-SiGe:H/nc-Si:H triple-junction structure.
Keywords :
Amorphous materials; Circuits; Current measurement; Design optimization; Manufacturing processes; Optical filters; Photovoltaic cells; Silicon; Voltage; Wavelength measurement;
Conference_Titel :
Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
Conference_Location :
San Diego, CA, USA
Print_ISBN :
978-1-4244-1640-0
Electronic_ISBN :
0160-8371
DOI :
10.1109/PVSC.2008.4922607