Title :
Testing of resistive bridging faults in CMOS flip-flop
Author :
Metra, Cecilia ; Favalli, Michele ; Olivo, Piero ; Riccò, Bruno
Author_Institution :
Bologna Univ., Italy
Abstract :
This paper provides an analysis of flip-flop testability with respect to resistive bridging faults. Problems inherent to their detection not encountered in combinational circuits are discussed, and practical solutions are proposed to overcome the main difficulties
Keywords :
CMOS integrated circuits; fault location; flip-flops; integrated circuit testing; logic testing; CMOS flip-flop; IC testing; flip-flop testability; resistive bridging faults; simulation; Analytical models; Circuit faults; Circuit testing; Delay; Electrical fault detection; Fault detection; Flip-flops; Logic; Master-slave; Semiconductor device modeling;
Conference_Titel :
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location :
Rotterdam
Print_ISBN :
0-8186-3360-3
DOI :
10.1109/ETC.1993.246616
