DocumentCode
3379064
Title
Testing of resistive bridging faults in CMOS flip-flop
Author
Metra, Cecilia ; Favalli, Michele ; Olivo, Piero ; Riccò, Bruno
Author_Institution
Bologna Univ., Italy
fYear
1993
fDate
19-22 Apr 1993
Firstpage
530
Lastpage
531
Abstract
This paper provides an analysis of flip-flop testability with respect to resistive bridging faults. Problems inherent to their detection not encountered in combinational circuits are discussed, and practical solutions are proposed to overcome the main difficulties
Keywords
CMOS integrated circuits; fault location; flip-flops; integrated circuit testing; logic testing; CMOS flip-flop; IC testing; flip-flop testability; resistive bridging faults; simulation; Analytical models; Circuit faults; Circuit testing; Delay; Electrical fault detection; Fault detection; Flip-flops; Logic; Master-slave; Semiconductor device modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
European Test Conference, 1993. Proceedings of ETC 93., Third
Conference_Location
Rotterdam
Print_ISBN
0-8186-3360-3
Type
conf
DOI
10.1109/ETC.1993.246616
Filename
246616
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