Title :
Flexible biomedical devices for mapping cardiac and neural electrophysiology
Author :
Kim, Dae-Hyeong ; Rogers, John A. ; Viventi, Jonathan ; Litt, Brian
Author_Institution :
Dept. of Mater. Sci. & Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
Abstract :
Clinical in-vivo electrophysiological measurements using standard technologies provide spatial resolution limited by the number of electrodes. Recent strategies demonstrate that high resolution is possible by use of active multiplexing silicon electronics, in flexible forms capable of integration with soft, curvilinear tissues of the body. In vivo cardiac mapping experiments with such technology illustrate in-situ mapping of the spread of electrocardiogram (ECG) waveforms from natural and paced beats. In other examples, circuits in ultrathin mesh formats on sheets of bioresorbable substrates of silk fibroin improve the ability of these systems to conformally wrap the tissue. Neural mapping experiments on feline animal models illustrate the utility of this approach. These concepts provide capabilities for implantable diagnostic and therapeutic systems, which cannot be realized with conventional, wafer-scale device designs.
Keywords :
bioelectric phenomena; biological tissues; biomedical electronics; biomedical equipment; electrocardiography; electroencephalography; prosthetics; ECG; active multiplexing silicon electronics; bioresorbable substrates; cardiac electrophysiology mapping; clinical in-vivo electrophysiological measurements; electrocardiogram waveforms; electrodes; feline animal models; flexible biomedical devices; implantable diagnostic systems; implantable therapeutic systems; in vivo cardiac mapping experiments; natural beats; neural electrophysiology mapping; neural mapping experiments; paced beats; silk fibroin; soft curvilinear tissues; spatial resolution; ultrathin mesh formats; wafer-scale device designs; Arrays; Electrodes; Monitoring; Silicon; Substrates; Surface impedance; cardiac; electrophysiology; flexible; mapping; neural; silk;
Conference_Titel :
Reliability Physics Symposium (IRPS), 2011 IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-9113-1
Electronic_ISBN :
1541-7026
DOI :
10.1109/IRPS.2011.5784461