DocumentCode :
3379229
Title :
Fully on-chip temperature, process, and voltage sensors
Author :
Chen, Shi-Wen ; Chang, Ming-Hung ; Hsieh, Wei-Chih ; Hwang, Wei
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
fYear :
2010
fDate :
May 30 2010-June 2 2010
Firstpage :
897
Lastpage :
900
Abstract :
A process, voltage, and temperature (PVT) sensor without a voltage/current analog-to-digital converter (ADC) or bandgap reference is proposed for high accuracy, low power, and wide voltage range portable applications. Conventional temperature sensors rely on voltage/current ADC for digital output code conversion. The proposed temperature sensor generates a clock frequency proportional to the measured temperature, and converts the frequency into a corresponding digital code. The generated digital code is still under the influence of PVT variations. Two distinct sensors for voltage and process monitoring are also proposed to enhance temperature sensor environmental variation immunity. The property of zero temperature coefficient (ZTC) bias point is used to remove temperature effect. The proposed wide voltage range low power PVT sensor is designed in UMC 65nm bulk CMOS technology. It is capable of operating over a wide voltage range within 0.3V~1V. The power consumption is no more than 3.7μW at 0.3V supply voltage and a high sample rate of 10k samples/sec. The temperature error is merely -0.8~0.8°C.
Keywords :
analogue-digital conversion; code convertors; frequency convertors; portable instruments; power consumption; temperature sensors; PVT sensor; PVT variation; analog-to-digital converter; bulk CMOS technology; digital output code conversion; environmental variation immunity; on-chip temperature sensors; process sensors; size 65 nm; voltage sensors; voltage-current ADC; wide voltage range portable application; zero temperature coefficient; Analog-digital conversion; CMOS technology; Clocks; Frequency conversion; Frequency measurement; Photonic band gap; Temperature distribution; Temperature measurement; Temperature sensors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
Conference_Location :
Paris
Print_ISBN :
978-1-4244-5308-5
Electronic_ISBN :
978-1-4244-5309-2
Type :
conf
DOI :
10.1109/ISCAS.2010.5537410
Filename :
5537410
Link To Document :
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