• DocumentCode
    3379259
  • Title

    Analysis of template matching prediction and its application to parametric overlapped block motion compensation

  • Author

    Wang, Tse-Wei ; Chen, Yi-Wen ; Peng, Wen-Hsiao

  • Author_Institution
    Dept. of Comput. Sci., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    2010
  • fDate
    May 30 2010-June 2 2010
  • Firstpage
    1563
  • Lastpage
    1566
  • Abstract
    Template matching prediction (TMP), which estimates the motion for a target block by using its surrounding pixels, has been observed to perform efficiently in inter-frame coding. In this paper, we expose, from a more theoretical viewpoint, the factors that determine the prediction efficiency of TMP. It is shown that the motion estimate found by template matching tends to be the motion associated with the template centroid and that TMP consistently outperforms SKIP prediction, but hardly competes with block motion compensation (BMC) unless both the motion and intensity fields are less random or have high spatial correlation. We also demonstrate how template and block motion estimates can jointly be applied in a parametric overlapped block motion compensation (OBMC) framework to further improve temporal prediction. Preliminary results show that combining TMP with OBMC can yield 2-16% reductions in mean-square prediction error, as compared with the single use of OBMC. The gain is even higher (18%) when the performance is compared with that of the standard BMC.
  • Keywords
    mean square error methods; motion compensation; motion estimation; video coding; OBMC; TMP; mean square prediction error; motion estimation; parametric overlapped block motion compensation; template matching prediction; Application software; Automatic voltage control; Computer science; Decoding; Motion analysis; Motion compensation; Motion estimation; Performance analysis; Performance gain; Predictive models;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), Proceedings of 2010 IEEE International Symposium on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5308-5
  • Electronic_ISBN
    978-1-4244-5309-2
  • Type

    conf

  • DOI
    10.1109/ISCAS.2010.5537412
  • Filename
    5537412