Title :
Recognition of distorted patterns by invariance kernels
Author :
Rubinstein, Jacob ; Segman, Joseph ; Zeevi, Yehoshua
Author_Institution :
Dept. of Math., Technion, Haifa, Israel
Abstract :
A method for the recognition of deformed patterns is presented. It is is shown that for planar deformations generated by Lie transformation groups, there exist kernels such that the associated integral transforms are invariant under the deformations. Many examples of deformations and the corresponding kernels are given. It is possible to extend the results to higher dimensions
Keywords :
Lie groups; invariance; pattern recognition; Lie transformation groups; deformed patterns; distorted patterns; integral transforms; invariance kernels; planar deformations; Fourier transforms; Jacobian matrices; Kernel; Mathematics; Moment methods; Pattern analysis; Pattern recognition;
Conference_Titel :
Pattern Recognition, 1990. Proceedings., 10th International Conference on
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-8186-2062-5
DOI :
10.1109/ICPR.1990.119347
