DocumentCode
3379267
Title
Recognition of distorted patterns by invariance kernels
Author
Rubinstein, Jacob ; Segman, Joseph ; Zeevi, Yehoshua
Author_Institution
Dept. of Math., Technion, Haifa, Israel
Volume
ii
fYear
1990
fDate
16-21 Jun 1990
Firstpage
159
Abstract
A method for the recognition of deformed patterns is presented. It is is shown that for planar deformations generated by Lie transformation groups, there exist kernels such that the associated integral transforms are invariant under the deformations. Many examples of deformations and the corresponding kernels are given. It is possible to extend the results to higher dimensions
Keywords
Lie groups; invariance; pattern recognition; Lie transformation groups; deformed patterns; distorted patterns; integral transforms; invariance kernels; planar deformations; Fourier transforms; Jacobian matrices; Kernel; Mathematics; Moment methods; Pattern analysis; Pattern recognition;
fLanguage
English
Publisher
ieee
Conference_Titel
Pattern Recognition, 1990. Proceedings., 10th International Conference on
Conference_Location
Atlantic City, NJ
Print_ISBN
0-8186-2062-5
Type
conf
DOI
10.1109/ICPR.1990.119347
Filename
119347
Link To Document