DocumentCode :
3379274
Title :
Oxide-apertured VCSELS with use of oxide/GaAs distributed Bragg reflectors and tunnel injection
Author :
Huffaker, D.L. ; Oh, T.H. ; Deppe, Dennis G.
Author_Institution :
Microelectronics Research Center, Department of Electrical and Computer Engineering, The University of Texas at Austin
Volume :
11
fYear :
1997
fDate :
18-23 May 1997
Firstpage :
195
Lastpage :
196
Keywords :
Apertures; Density measurement; Distributed Bragg reflectors; Gain measurement; Gallium arsenide; Mirrors; Optical scattering; Threshold voltage; Vertical cavity surface emitting lasers; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 1997. CLEO '97., Summaries of Papers Presented at the Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
0-7803-4125-2
Type :
conf
DOI :
10.1109/CLEO.1997.602459
Filename :
602459
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3379274
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