DocumentCode :
3379293
Title :
Progress toward a benchmark solution for 3-D, perfectly conducting scatterers with edges and corners
Author :
Yaghjian, A.D. ; Cote, M.G. ; Woodworth, M.B.
Author_Institution :
Rome Air Dev. Center, Hanscom AFB, MA, USA
fYear :
1988
fDate :
6-10 June 1988
Firstpage :
1359
Abstract :
The authors present the predicted and measured E-plane, H-plane, and 45 degrees -plane scattered fields from the perfectly conducting cube for broadside plane-wave incidence. Although the scattering patterns are obtained for a plane-wave incident broadside upon the front face of the cube, the magnetic-field integral equation solutions can easily accommodate plane-wave illumination from an arbitrary direction, or illumination by an incident field other than a plane wave. However, the uniform high-frequency solution is valid only for broadside plane-wave incidence.<>
Keywords :
electrical engineering computing; electromagnetic wave diffraction; electromagnetic wave scattering; 3-D scatterers; 45 degree-plane scattered fields; E-plane scattered fields; EM wave scattering; H-plane scattered fields; benchmark solution; broadside plane-wave incidence; corners; edges; magnetic-field integral equation solutions; perfectly conducting cube; scattering patterns; uniform high-frequency solution; wedge diffraction; Diffraction; Frequency measurement; Integral equations; Length measurement; Magnetic field measurement; Magnetic resonance; Particle measurements; Radar cross section; Radar scattering; Rayleigh scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 1988. AP-S. Digest
Conference_Location :
Syracuse, NY, USA
Type :
conf
DOI :
10.1109/APS.1988.94352
Filename :
94352
Link To Document :
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