DocumentCode :
3379386
Title :
Low power shift registers for megabits CMOS image sensors
Author :
Wang, Jinn-Shyan ; Hsieh, Tsung-Han ; Chang, Keng-Jui ; Yeh, Chingwei
Author_Institution :
Dept. of Electr. Eng., Chung-Cheng Univ., Chiayi, Taiwan
fYear :
2011
fDate :
25-28 Oct. 2011
Firstpage :
17
Lastpage :
20
Abstract :
This study investigated the design of low-power shift registers (SR) for CMOS image sensors. First we analyzed a classic clock-gating-control-unit (CGCU) based SR, and showed that besides inefficient area utilization, the CGCU SR is subject to high power consumption due to coupling noise and leakage current. In this work, we developed new design techniques called LGCS (locally gated clock signals) and EDCD (equally divided clock domains) to construct a low-power SR. Experimental results show that the new SR achieves a 14X power reduction and a 39% area reduction compared to the CGCU SR.
Keywords :
CMOS image sensors; leakage currents; logic circuits; noise; shift registers; CGCU based SR; classic clock-gating-control-unit; high power consumption; leakage current; locally gated clock signal; low power shift register; megabits CMOS image sensor; noise; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ASIC (ASICON), 2011 IEEE 9th International Conference on
Conference_Location :
Xiamen
ISSN :
2162-7541
Print_ISBN :
978-1-61284-192-2
Electronic_ISBN :
2162-7541
Type :
conf
DOI :
10.1109/ASICON.2011.6157111
Filename :
6157111
Link To Document :
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