DocumentCode
3379386
Title
Low power shift registers for megabits CMOS image sensors
Author
Wang, Jinn-Shyan ; Hsieh, Tsung-Han ; Chang, Keng-Jui ; Yeh, Chingwei
Author_Institution
Dept. of Electr. Eng., Chung-Cheng Univ., Chiayi, Taiwan
fYear
2011
fDate
25-28 Oct. 2011
Firstpage
17
Lastpage
20
Abstract
This study investigated the design of low-power shift registers (SR) for CMOS image sensors. First we analyzed a classic clock-gating-control-unit (CGCU) based SR, and showed that besides inefficient area utilization, the CGCU SR is subject to high power consumption due to coupling noise and leakage current. In this work, we developed new design techniques called LGCS (locally gated clock signals) and EDCD (equally divided clock domains) to construct a low-power SR. Experimental results show that the new SR achieves a 14X power reduction and a 39% area reduction compared to the CGCU SR.
Keywords
CMOS image sensors; leakage currents; logic circuits; noise; shift registers; CGCU based SR; classic clock-gating-control-unit; high power consumption; leakage current; locally gated clock signal; low power shift register; megabits CMOS image sensor; noise; Switches;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC (ASICON), 2011 IEEE 9th International Conference on
Conference_Location
Xiamen
ISSN
2162-7541
Print_ISBN
978-1-61284-192-2
Electronic_ISBN
2162-7541
Type
conf
DOI
10.1109/ASICON.2011.6157111
Filename
6157111
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