Title : 
Production ready 30% efficient triple junction space solar cells
         
        
            Author : 
Fetzer, Chris ; Jun, Bongim ; Edmondson, Kenneth ; Khemthong, Scott ; Rouhani, Kaveh ; Cravens, Robert ; Bardfield, Rina ; Gillanders, Mark
         
        
            Author_Institution : 
Spectrolab, Inc., 12500 Gladstone Ave., Sylmar, CA 91342 USA
         
        
        
        
        
        
            Abstract : 
Spectrolab presents its next production GaInP/GaAs/Ge space triple junction solar cell, the XTJ space solar cell, averaging 29.8% efficiency at maximum power (AM0, 28°C, 135.3 mW/cm2) at beginning-of-life (BOL) testing of large populations (845 cells) of large-area solar cells without coverglass. Bare cells from this population with area of 26.62 cm2 have been tested to a maximum efficiency of 31.1% under the same AM0 testing. Additional optical and electrical performance characterization will be presented. XTJ is more than a BOL power improvement over heritage products. Bare cell radiation testing shows power retention at max power (NPmp) of 0.89 and 0.84 after irradiation with 1-MeV energy electrons to a fluence of 5e14 cm−2 and 1e15 cm−2, respectively. Environmental degradation testing of XTJ parts shows only 1.7% degradation for more than 4000 hours at 250°C and no degradation after 90 days at 95% r.h. and 45°C. Together these characteristics enable XTJ to be a 7% improvement in end-of-life cost of power on space flight panel over Spectrolab´s 28% BOL efficient UTJ. Finally, XTJ engineering confidence thermal cycle testing and qualification status to the AIAA S-111-2005 standard will be elaborated.
         
        
            Keywords : 
Aerospace engineering; Costs; Electron optics; Gallium arsenide; Photovoltaic cells; Power engineering and energy; Production; Testing; Thermal degradation; Thermal engineering;
         
        
        
        
            Conference_Titel : 
Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
         
        
            Conference_Location : 
San Diego, CA, USA
         
        
        
            Print_ISBN : 
978-1-4244-1640-0
         
        
            Electronic_ISBN : 
0160-8371
         
        
        
            DOI : 
10.1109/PVSC.2008.4922620