DocumentCode
3379440
Title
Electrical properties of Mg doped C60 thin films
Author
Kojima, Nobuaki ; Natori, Masato ; Suzuki, Hidetoshi ; Yamaguchi, Masafumi
Author_Institution
Toyota Technological Institute, 2-12-1 Hisakata, Tempaku, Nagoya 468-8511, JAPAN
fYear
2008
fDate
11-16 May 2008
Firstpage
1
Lastpage
3
Abstract
C60 solids have been known as high resistive semiconductor materials. Such high resistivity is one of the reasons of low charge transport efficiency in organic solar cells. Mg doping in C60 films was done by the co-evaporation method of C60 and Mg sources. The conductivity could be controlled by the composition ratio of Mg/C60 , and its dependence is divided into 3 ranges (Mg/C60 = 0∼2, 2∼6, ≫6). Temperature dependence of the conductivity shows hopping conduction mechanism, and suggesting the same hopping center origin in the first and second ranges. From Raman scattering spectroscopy and XRD measurements, the crystal structure disordering by Mg-doping was observed. It is thought that Mg composition dependence of the conductivity is related to both of the conduction mechanism change and the structural change.
Keywords
Conductivity; Photovoltaic cells; Raman scattering; Semiconductor device doping; Semiconductor films; Semiconductor materials; Semiconductor thin films; Solids; Spectroscopy; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
Conference_Location
San Diego, CA, USA
ISSN
0160-8371
Print_ISBN
978-1-4244-1640-0
Electronic_ISBN
0160-8371
Type
conf
DOI
10.1109/PVSC.2008.4922622
Filename
4922622
Link To Document