DocumentCode :
3379440
Title :
Electrical properties of Mg doped C60 thin films
Author :
Kojima, Nobuaki ; Natori, Masato ; Suzuki, Hidetoshi ; Yamaguchi, Masafumi
Author_Institution :
Toyota Technological Institute, 2-12-1 Hisakata, Tempaku, Nagoya 468-8511, JAPAN
fYear :
2008
fDate :
11-16 May 2008
Firstpage :
1
Lastpage :
3
Abstract :
C60 solids have been known as high resistive semiconductor materials. Such high resistivity is one of the reasons of low charge transport efficiency in organic solar cells. Mg doping in C60 films was done by the co-evaporation method of C60 and Mg sources. The conductivity could be controlled by the composition ratio of Mg/C60, and its dependence is divided into 3 ranges (Mg/C60 = 0∼2, 2∼6, ≫6). Temperature dependence of the conductivity shows hopping conduction mechanism, and suggesting the same hopping center origin in the first and second ranges. From Raman scattering spectroscopy and XRD measurements, the crystal structure disordering by Mg-doping was observed. It is thought that Mg composition dependence of the conductivity is related to both of the conduction mechanism change and the structural change.
Keywords :
Conductivity; Photovoltaic cells; Raman scattering; Semiconductor device doping; Semiconductor films; Semiconductor materials; Semiconductor thin films; Solids; Spectroscopy; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
Conference_Location :
San Diego, CA, USA
ISSN :
0160-8371
Print_ISBN :
978-1-4244-1640-0
Electronic_ISBN :
0160-8371
Type :
conf
DOI :
10.1109/PVSC.2008.4922622
Filename :
4922622
Link To Document :
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