Title :
ADDLL/VDD-biasing co-design for process characterization, performance calibration, and clock synchronization in variation-tolerant designs
Author :
Wang, Linn-Shyan ; Chien, Yung-Chen ; Lin, Lia-Hong ; Cheng, Chun-Yuan ; Ma, Ying-Ting ; Huang, Chung-Hsun
Author_Institution :
Dept. of Electr. Eng., Chung-Cheng Univ., Chiayi, Taiwan
Abstract :
This work proposes an ADDLL/VDD-biasing co-design methodology for variation-tolerant designs. A modified ADDLL behaves as a variability sensor in the beginning of operation, and the sensing result is used by a VDD-biasing circuit to adjust the VDD of a loaded design for performance calibration. During normal operation, the ADDLL is reused as a de-skewing element for the calibrated design. With this methodology, not only the performance of the loaded design but also that of the ADDLL can be effectively adjusted toward their design specifications even under serious process variations.
Keywords :
CMOS digital integrated circuits; calibration; integrated circuit design; synchronisation; system-on-chip; ADDLL-VDD-biasing codesign methodology; SoC; calibrated design; clock synchronization; de-skewing element; loaded design; nanometer CMOS technologies; performance calibration; process characterization; variability sensor; variation-tolerant designs; CMOS integrated circuits; CMOS technology; Calibration; Clocks;
Conference_Titel :
ASIC (ASICON), 2011 IEEE 9th International Conference on
Conference_Location :
Xiamen
Print_ISBN :
978-1-61284-192-2
Electronic_ISBN :
2162-7541
DOI :
10.1109/ASICON.2011.6157119