Title :
Characterizing bipolar rating scales to investigate potency of eWOM messages involving attitude directionwithout its strength
Author_Institution :
Fac. of Bus. Adm., Kinki Univ., Higashi-Osaka, Japan
Abstract :
Electronic word-of-mouth (eWOM) is an important information source that influences consumer product evaluations. The author previously developed a computational model, called an inference space model, that predicts potency-magnitude relations of eWOM messages involving subjective rank expressions, which refer to the linguistic representations related to the attitude-levels of the benefits of product attributes. This paper mathematically investigates the potencymagnitude relations of message types differentiating the attitude direction and the strength. The investigations include the developments of a Q-magnitude Relation Map (Q-Map) which illustrates how the relations change based on the values of two parameters: evaluation target size and scale-size balancing indicator. The results show that three scale-classes of bipolar rating scales have a critical role in knowing how the relations change. Based on observations of the Q-Maps, unexplored hypotheses on the potency-magnitude relations are developed with respect to messages involving attitude direction without its strength.
Keywords :
consumer behaviour; linguistics; marketing data processing; social networking (online); Q-Map; Q-magnitude relation map; attitude direction; bipolar rating scale characterization; computational model; consumer product evaluations; eWOM message potency; electronic word-of-mouth; evaluation target size; inference space model; information source; linguistic representations; potency-magnitude relation prediction; product attributes; scale-size balancing indicator; subjective rank expressions; Computational modeling; MONOS devices; attitude change; bipolar rating scale; cognitive modeling; computational model; electronic word-of-mouth;
Conference_Titel :
Cognitive Informatics & Cognitive Computing (ICCI*CC), 2013 12th IEEE International Conference on
Conference_Location :
New York, NY
Print_ISBN :
978-1-4799-0781-6
DOI :
10.1109/ICCI-CC.2013.6622257