• DocumentCode
    3379687
  • Title

    Implantable microtechnologies for the brain: Challenges and strategies for reliable operation

  • Author

    Muthuswamy, Jit ; Anand, Sindhu ; Sutanto, Jemmy ; Baker, Michael ; Okandan, Murat

  • Author_Institution
    Sch. of Biol. Health Syst. Eng., Arizona State Univ., Tempe, AZ, USA
  • fYear
    2011
  • fDate
    10-14 April 2011
  • Abstract
    Implantable microtechnologies and microelectrodes are crucial for the success for the next generation of prosthetic devices for the brain. This paper reviews some of the challenges in developing reliable technologies that will interface with neurons in the brain. We also recount here some of the milestones in our own successful effort to create interfaces with neurons in the brain. We have used a novel approach of developing neural interfaces using MEMS technologies that can be moved within the brain after implantation. The strategy is to enhance reliability by either creating stable neuron-electrode interfaces or by seeking new neuron electrode interfaces in the event of failure or deterioration of function in the interface. We have developed novel microactuators, microelectrodes, packaging and interconnect technologies to achieve the above goals. The success of this technology in recording good quality neuronal signals in chronic experiments, analysis of failure modes, the packaging efforts and reliability analysis to improve the longevity of the implant is addressed below.
  • Keywords
    bioMEMS; biomedical electrodes; brain; microactuators; microelectrodes; prosthetics; reliability; MEMS technologies; brain; failure modes; implant longevity; implantable microtechnologies; interconnect technologies; microactuators; microelectrodes; neural interfaces; neuron-electrode interfaces; neuronal signals; packaging technologies; prosthetic devices; reliable operation; Actuators; Brain; Fluids; Microelectrodes; Micromechanical devices; Neurons; Packaging; MEMS; flip-chip; microelectrode; neural recording; packaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium (IRPS), 2011 IEEE International
  • Conference_Location
    Monterey, CA
  • ISSN
    1541-7026
  • Print_ISBN
    978-1-4244-9113-1
  • Electronic_ISBN
    1541-7026
  • Type

    conf

  • DOI
    10.1109/IRPS.2011.5784480
  • Filename
    5784480