DocumentCode
3379687
Title
Implantable microtechnologies for the brain: Challenges and strategies for reliable operation
Author
Muthuswamy, Jit ; Anand, Sindhu ; Sutanto, Jemmy ; Baker, Michael ; Okandan, Murat
Author_Institution
Sch. of Biol. Health Syst. Eng., Arizona State Univ., Tempe, AZ, USA
fYear
2011
fDate
10-14 April 2011
Abstract
Implantable microtechnologies and microelectrodes are crucial for the success for the next generation of prosthetic devices for the brain. This paper reviews some of the challenges in developing reliable technologies that will interface with neurons in the brain. We also recount here some of the milestones in our own successful effort to create interfaces with neurons in the brain. We have used a novel approach of developing neural interfaces using MEMS technologies that can be moved within the brain after implantation. The strategy is to enhance reliability by either creating stable neuron-electrode interfaces or by seeking new neuron electrode interfaces in the event of failure or deterioration of function in the interface. We have developed novel microactuators, microelectrodes, packaging and interconnect technologies to achieve the above goals. The success of this technology in recording good quality neuronal signals in chronic experiments, analysis of failure modes, the packaging efforts and reliability analysis to improve the longevity of the implant is addressed below.
Keywords
bioMEMS; biomedical electrodes; brain; microactuators; microelectrodes; prosthetics; reliability; MEMS technologies; brain; failure modes; implant longevity; implantable microtechnologies; interconnect technologies; microactuators; microelectrodes; neural interfaces; neuron-electrode interfaces; neuronal signals; packaging technologies; prosthetic devices; reliable operation; Actuators; Brain; Fluids; Microelectrodes; Micromechanical devices; Neurons; Packaging; MEMS; flip-chip; microelectrode; neural recording; packaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability Physics Symposium (IRPS), 2011 IEEE International
Conference_Location
Monterey, CA
ISSN
1541-7026
Print_ISBN
978-1-4244-9113-1
Electronic_ISBN
1541-7026
Type
conf
DOI
10.1109/IRPS.2011.5784480
Filename
5784480
Link To Document