Double-pulse-single-event transients in combinational logic

Author

Ahlbin, J.R. ; Loveless, T.D. ; Ball, D.R. ; Bhuva, B.L. ; Witulski, A.F. ; Massengill, L.W. ; Gadlage, M.J.

Author_Institution

Dept. of Elec. Eng. & Comp. Sci., Vanderbilt Univ., Nashville, TN, USA

fYear

2011

fDate

10-14 April 2011

Abstract

For the first time, double-pulse-single-event transients (DPSETs) are observed during heavy-ion broad beam testing. The transients are generated in a serially connected string of inverters and measured with an autonomous on-chip SET pulse-width measurement circuit. Three-dimensional mixed-mode technology computer aided design (TCAD) simulations show that DPSETs are the result of multiple inverters being upset by a single ion strike.

Keywords

CAD; combinational circuits; logic design; autonomous on-chip SET pulse-width measurement circuit; combinational logic; double-pulse-single-event transients; heavy-ion broad beam testing; inverters; three-dimensional mixed-mode technology computer aided design; Computational modeling; Integrated circuit modeling; Inverters; Pulse measurements; Time measurement; Transient analysis; Transistors; SER; SET; charge sharing; double-pulse-single-event transients; pulse quenching; pulse width; radiation environment; single event; single-event transient; soft error;

fLanguage

English

Publisher

ieee

Conference_Titel

Reliability Physics Symposium (IRPS), 2011 IEEE International

Conference_Location

Monterey, CA

ISSN

1541-7026

Print_ISBN

978-1-4244-9113-1

Electronic_ISBN

1541-7026

Type

conf

DOI

10.1109/IRPS.2011.5784486

Filename

5784486