Title :
Double-pulse-single-event transients in combinational logic
Author :
Ahlbin, J.R. ; Loveless, T.D. ; Ball, D.R. ; Bhuva, B.L. ; Witulski, A.F. ; Massengill, L.W. ; Gadlage, M.J.
Author_Institution :
Dept. of Elec. Eng. & Comp. Sci., Vanderbilt Univ., Nashville, TN, USA
Abstract :
For the first time, double-pulse-single-event transients (DPSETs) are observed during heavy-ion broad beam testing. The transients are generated in a serially connected string of inverters and measured with an autonomous on-chip SET pulse-width measurement circuit. Three-dimensional mixed-mode technology computer aided design (TCAD) simulations show that DPSETs are the result of multiple inverters being upset by a single ion strike.
Keywords :
CAD; combinational circuits; logic design; autonomous on-chip SET pulse-width measurement circuit; combinational logic; double-pulse-single-event transients; heavy-ion broad beam testing; inverters; three-dimensional mixed-mode technology computer aided design; Computational modeling; Integrated circuit modeling; Inverters; Pulse measurements; Time measurement; Transient analysis; Transistors; SER; SET; charge sharing; double-pulse-single-event transients; pulse quenching; pulse width; radiation environment; single event; single-event transient; soft error;
Conference_Titel :
Reliability Physics Symposium (IRPS), 2011 IEEE International
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-9113-1
Electronic_ISBN :
1541-7026
DOI :
10.1109/IRPS.2011.5784486
