• DocumentCode
    337982
  • Title

    Characterization of the SAW propagation properties for zinc oxide films on silicon carbide

  • Author

    Hickernell, Fred S.

  • Author_Institution
    Motorola Inc., Scottsdale, AZ, USA
  • Volume
    1
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    273
  • Abstract
    The surface acoustic wave (SAW) propagation properties of zinc oxide (ZnO) films on silicon carbide (SiC) have been initially characterized using interdigital transducer (IDT) structures in four configurations. The dc triode sputtered ZnO films were 400 nm in thickness and the interdigital electrodes were processed on the film surface and at the film/substrate interface with and without a thin shorting metal at the opposite boundary of the ZnO film. The measurements characterized the velocity, propagation loss, and transducer conversion loss of the SAW modes. A generalized SAW mode with velocities between 6000 and 7000 m/s were observed as well as a strong high velocity pseudo-SAW mode with velocities in the 12 000 to 13 000 m/s region. The propagation loss for both modes was 10 dB/cm at 600 MHz and followed a frequency squared loss characteristic
  • Keywords
    II-VI semiconductors; piezoelectric semiconductors; piezoelectric thin films; semiconductor thin films; sputtered coatings; substrates; surface acoustic wave devices; surface acoustic waves; zinc compounds; DC triode sputtered ZnO films; SAW modes; SAW propagation properties; SiC; ZnO; characterization; film/substrate interface; frequency squared loss characteristic; interdigital transducer structures; strong high velocity pseudo-SAW mode; surface acoustic wave; thin shorting metal; transducer conversion loss; velocity; Acoustic propagation; Acoustic transducers; Acoustic waves; Electrodes; Propagation losses; Semiconductor films; Silicon carbide; Substrates; Surface acoustic waves; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE
  • Conference_Location
    Sendai
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-4095-7
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1998.762144
  • Filename
    762144