Title :
High power-durable and low loss single-crystalline Al/Ti electrodes for RF SAW devices
Author :
Kimura, Noritoshi ; Nakano, Masahiro ; Sato, Katsuo
Author_Institution :
Adv. Products Dev. Center, TDK Corp., Ichikawa, Japan
Abstract :
In order to improve the power-durability of the electrodes in a RF SAW device, single-crystalline Al/Ti films were successfully grown on 64°Y-X LiNbO3 substrates by the conventional electron-beam vapor deposition technique. It is clear that the insertion loss of RF SAW filters with the single-crystalline electrodes was lower by about 0.1 dB compared with those with polycrystalline Al electrodes. Moreover, the time to failure for the single-crystalline electrodes became approximately 700 times longer than that for Al-Cu alloy electrodes which have been widely used in high-power RF SAW devices
Keywords :
aluminium; electrodes; electron beam deposition; losses; surface acoustic wave filters; titanium; 0.1 dB; 64°Y-X LiNbO3 substrates; Al-Ti; LiNbO3; RF SAW devices; SAW filters; electron-beam vapor deposition; insertion loss; power-durability; single-crystalline Al/Ti electrodes; single-crystalline films; time to failure; Aluminum alloys; Ambient intelligence; Artificial intelligence; Chemical vapor deposition; Electrodes; Radio frequency; Scanning electron microscopy; Stress; Substrates; Surface acoustic wave devices;
Conference_Titel :
Ultrasonics Symposium, 1998. Proceedings., 1998 IEEE
Conference_Location :
Sendai
Print_ISBN :
0-7803-4095-7
DOI :
10.1109/ULTSYM.1998.762154