• DocumentCode
    3380538
  • Title

    Impact of electron and heavy hole confinement depth ratio on the performance of III–V p-i-n multi-quantum well solar cells

  • Author

    Alemu, Andenet ; Coaquira, Jose A.H. ; Freundlich, Alex

  • Author_Institution
    Photovoltaics and Nanostructures Laboratories, Center for Advanced Materials, University of Houston, Texas 77204-5507, USA
  • fYear
    2008
  • fDate
    11-16 May 2008
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    A number of III–V p-i-n multi-quantum well solar cells exhibiting identical p and n regions, similar intrinsic region thickness and radiative recombination energies but varying well composition and thickness are investigated. Theoretically calculated electron and hole confinement depths varied among samples due to differences in well material parameters. The ratio of electron confinement depth to the total offset in optical band-gap was found to vary between samples. Those exhibiting smaller ratios were systematically found to perform better. In addition, the effective potential barrier encountered by one of the carriers was found to match the radiative recombination activation energy determined from photoluminescence measurements. Devices with better photovoltaic characteristics were found to display radiative recombination activation energies directly proportional to their respective electron confinement depth. These observations are tentatively explained in terms of carrier dynamics occurring in the intrinsic region
  • Keywords
    Carrier confinement; Charge carrier processes; Electron optics; Energy measurement; Optical materials; PIN photodiodes; Photoluminescence; Photonic band gap; Photovoltaic cells; Radiative recombination;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0160-8371
  • Print_ISBN
    978-1-4244-1640-0
  • Electronic_ISBN
    0160-8371
  • Type

    conf

  • DOI
    10.1109/PVSC.2008.4922671
  • Filename
    4922671