DocumentCode
3380538
Title
Impact of electron and heavy hole confinement depth ratio on the performance of III–V p-i-n multi-quantum well solar cells
Author
Alemu, Andenet ; Coaquira, Jose A.H. ; Freundlich, Alex
Author_Institution
Photovoltaics and Nanostructures Laboratories, Center for Advanced Materials, University of Houston, Texas 77204-5507, USA
fYear
2008
fDate
11-16 May 2008
Firstpage
1
Lastpage
3
Abstract
A number of III–V p-i-n multi-quantum well solar cells exhibiting identical p and n regions, similar intrinsic region thickness and radiative recombination energies but varying well composition and thickness are investigated. Theoretically calculated electron and hole confinement depths varied among samples due to differences in well material parameters. The ratio of electron confinement depth to the total offset in optical band-gap was found to vary between samples. Those exhibiting smaller ratios were systematically found to perform better. In addition, the effective potential barrier encountered by one of the carriers was found to match the radiative recombination activation energy determined from photoluminescence measurements. Devices with better photovoltaic characteristics were found to display radiative recombination activation energies directly proportional to their respective electron confinement depth. These observations are tentatively explained in terms of carrier dynamics occurring in the intrinsic region
Keywords
Carrier confinement; Charge carrier processes; Electron optics; Energy measurement; Optical materials; PIN photodiodes; Photoluminescence; Photonic band gap; Photovoltaic cells; Radiative recombination;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2008. PVSC '08. 33rd IEEE
Conference_Location
San Diego, CA, USA
ISSN
0160-8371
Print_ISBN
978-1-4244-1640-0
Electronic_ISBN
0160-8371
Type
conf
DOI
10.1109/PVSC.2008.4922671
Filename
4922671
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