• DocumentCode
    3380547
  • Title

    Towards the next generation of low-power test technologies

  • Author

    Wen, Xiaoqing

  • Author_Institution
    Dept. of Comput. Syst. & Eng., Kyushu Inst. of Technol., Iizuka, Japan
  • fYear
    2011
  • fDate
    25-28 Oct. 2011
  • Firstpage
    232
  • Lastpage
    235
  • Abstract
    This paper first describes the basics of VLSI testing and the impact of test power. It then reviews the current status of low-power testing. It further highlights the needs for the next generation of low-power test technologies, which are critical for low-power devices in the deep submicron era.
  • Keywords
    VLSI; integrated circuit testing; low-power electronics; VLSI testing; deep submicron era; impact; low-power device; low-power test technology; low-power testing; next generation; test power;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC (ASICON), 2011 IEEE 9th International Conference on
  • Conference_Location
    Xiamen
  • ISSN
    2162-7541
  • Print_ISBN
    978-1-61284-192-2
  • Electronic_ISBN
    2162-7541
  • Type

    conf

  • DOI
    10.1109/ASICON.2011.6157164
  • Filename
    6157164
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3380547